Resonant X-Ray Scattering in Correlated Systems

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Murakami, Youichi (Επιμελητής έκδοσης), Ishihara, Sumio (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2017.
Σειρά:Springer Tracts in Modern Physics, 269
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara)
  • Resonant X-ray scattering in 3d electron systems (H. Nakao)
  • Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura)
  • Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima)
  • Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati)
  • Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).