Multi-run Memory Tests for Pattern Sensitive Faults

Multi-run Memory Tests for Pattern Sensitive Faults

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...

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Bibliographic Details
Main Author: Mrozek, Ireneusz (Author, http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:1st ed. 2019.
Subjects:
Electronic circuits.
Microprocessors.
Electronics.
Microelectronics.
Circuits and Systems.
Processor Architectures.
Electronics and Microelectronics, Instrumentation.
Online Access:Full Text via HEAL-Link

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ΒΚΠ - Πατρα: ALFd

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ΒΚΠ - Πατρα: BSC

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Call Number: 330.01 BAU
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