Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...

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Bibliographic Details
Main Authors: Goldstein, Joseph I. (Author, http://id.loc.gov/vocabulary/relators/aut), Newbury, Dale E. (http://id.loc.gov/vocabulary/relators/aut), Michael, Joseph R. (http://id.loc.gov/vocabulary/relators/aut), Ritchie, Nicholas W.M (http://id.loc.gov/vocabulary/relators/aut), Scott, John Henry J. (http://id.loc.gov/vocabulary/relators/aut), Joy, David C. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2018.
Edition:4th ed. 2018.
Subjects:
Materials science.
Spectroscopy.
Microscopy.
Physical measurements.
Measurement   .
Characterization and Evaluation of Materials.
Spectroscopy and Microscopy.
Biological Microscopy.
Spectroscopy/Spectrometry.
Measurement Science and Instrumentation.
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