Helium Ion Microscopy Principles and Applications /

Helium Ion Microscopy Principles and Applications /

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered includ...

Full description

Bibliographic Details
Main Author: Joy, David C. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2013.
Series:SpringerBriefs in Materials,
Subjects:
Materials science.
Spectroscopy.
Nanoscale science.
Nanoscience.
Nanostructures.
Microscopy.
Nanotechnology.
Materials Science.
Characterization and Evaluation of Materials.
Spectroscopy and Microscopy.
Spectroscopy/Spectrometry.
Nanoscale Science and Technology.
Online Access:Full Text via HEAL-Link

Internet

Full Text via HEAL-Link

ΒΚΠ - Πατρα: ALFd

Holdings details from ΒΚΠ - Πατρα: ALFd
Call Number: 330.01 BAU
Copy 1 Available

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
Copy 2 Available
Copy 3 Available

Similar Items