Advanced Verification Techniques: A SystemC Based Approach for Successful Tapeout

Advanced Verification Techniques: A SystemC Based Approach for Successful Tapeout

"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and t...

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Bibliographic Details
Main Authors: Singh, Leena (Author), Drucker, Leonard (Author), Khan, Neyaz (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US, 2004.
Subjects:
Engineering.
Computer-aided engineering.
Electrical engineering.
Electronic circuits.
Circuits and Systems.
Electrical Engineering.
Computer-Aided Engineering (CAD, CAE) and Design.
Online Access:Full Text via HEAL-Link

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ΒΚΠ - Πατρα: ALFd

Holdings details from ΒΚΠ - Πατρα: ALFd
Call Number: 330.01 BAU
Copy 1 Available

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
Copy 2 Available
Copy 3 Available

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