Leakage in Nanometer CMOS Technologies

Leakage in Nanometer CMOS Technologies

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Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumptio...

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Bibliographic Details
Main Authors: Narendra, Siva G. (Author), Chandrakasan, Anantha (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US, 2006.
Series:Series on Integrated Circuits and Systems,
Subjects:
Engineering.
Computer hardware.
Computer-aided engineering.
Electrical engineering.
Electronics.
Microelectronics.
Electronic circuits.
Nanotechnology.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Electronics and Microelectronics, Instrumentation.
Computer Hardware.
Electrical Engineering.
Online Access:Full Text via HEAL-Link

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ΒΚΠ - Πατρα: ALFd

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Call Number: 330.01 BAU
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ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
Copy 2 Available
Copy 3 Available

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