Testing and testable design of high-density random-access memories /
| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston, Mass :
Kluwer Academic,
1996.
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| Series: | Frontiers in electronic testing
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| Subjects: |
| Physical Description: | xxxviii, 386 σ. : εικ. ; 25 εκ. |
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| Bibliography: | Περιλαμβάνει βιβλιογραφικές παραπομπές και ευρετήριο. |
| ISBN: | 0792397827 |
