Random Testing of Digital Circuits Theory and Applications

Random Testing of Digital Circuits Theory and Applications

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	David, Rene (Συγγραφέας)
Μορφή:	Βιβλίο
Γλώσσα:	English
Έκδοση:	New York Marcel Dekker Inc. c1998
Θέματα:	DIGITAL INTEGRATED CIRCUITS INTEGRATED CIRCUITS Δοκιμές ΕΠΕΑΕΚ

Παρόμοια τεκμήρια

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