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| LEADER |
01803nam a2200505 4500 |
| 001 |
ocn810936286 |
| 003 |
OCoLC |
| 005 |
20170124071647.7 |
| 006 |
m o d |
| 007 |
cr un||||||||| |
| 008 |
120924s2012 nju ob 000 0 eng d |
| 040 |
|
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|a UIU
|b eng
|e pn
|c UIU
|d E7B
|d DG1
|d UIU
|d DG1
|d OCLCF
|d OCLCQ
|d AZK
|d GrThAP
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| 019 |
|
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|a 961531647
|a 962709879
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| 020 |
|
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|a 9781118360668
|q (electronic bk.)
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| 020 |
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|a 1118360664
|q (electronic bk.)
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| 020 |
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|z 9780470638828
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| 020 |
|
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|z 0470638826
|
| 029 |
1 |
|
|a AU@
|b 000050066052
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| 029 |
1 |
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|a CHBIS
|b 009914395
|
| 029 |
1 |
|
|a CHVBK
|b 193006073
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| 029 |
1 |
|
|a DEBBG
|b BV041828993
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| 029 |
1 |
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|a DKDLA
|b 820120-katalog:000599972
|
| 029 |
1 |
|
|a NZ1
|b 14976716
|
| 035 |
|
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|a (OCoLC)810936286
|z (OCoLC)961531647
|z (OCoLC)962709879
|
| 050 |
|
4 |
|a QH212.A78
|b H38 2012
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| 082 |
0 |
4 |
|a 620/.5
|2 23
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| 049 |
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|a MAIN
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| 100 |
1 |
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|a Haugstad, Greg,
|d 1963-
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| 245 |
1 |
0 |
|a Atomic force microscopy :
|b exploring basic modes and advanced applications /
|c Greg Haugstad.
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| 264 |
|
1 |
|a Hoboken, N.J. :
|b John Wiley & Sons,
|c [2012]
|
| 264 |
|
4 |
|c ©2012
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| 300 |
|
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|a 1 online resource
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
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|a computer
|b c
|2 rdamedia
|
| 338 |
|
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|a online resource
|b cr
|2 rdacarrier
|
| 347 |
|
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|a data file
|2 rda
|
| 380 |
|
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|a Bibliography
|
| 504 |
|
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|a Includes bibliographical references.
|
| 588 |
0 |
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|a Print version record.
|
| 650 |
|
0 |
|a Atomic force microscopy.
|
| 650 |
|
7 |
|a Atomic force microscopy.
|2 fast
|0 (OCoLC)fst00820609
|
| 655 |
|
4 |
|a Electronic books.
|
| 776 |
0 |
8 |
|i Print version:
|a Haugstad, Greg, 1963-
|t Atomic force microscopy.
|d Hoboken, N.J. : John Wiley & Sons, ©2012
|z 9780470638828
|w (DLC) 2012003429
|w (OCoLC)682892479
|
| 856 |
4 |
0 |
|u https://doi.org/10.1002/9781118360668
|z Full Text via HEAL-Link
|
| 994 |
|
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|a 92
|b DG1
|
