|
|
|
|
| LEADER |
00945nam a2200265 u 4500 |
| 001 |
10105489 |
| 003 |
upatras |
| 005 |
20210117204159.0 |
| 008 |
991223s1997 f eng |
| 020 |
|
|
|a 0 12 434330 9
|
| 040 |
|
|
|a Βιβλιοθήκη ΙΤΥ
|c Βιβλιοθήκη ΙΤΥ
|
| 040 |
|
|
|a XX-XxUND
|c Βιβλιοθήκη ΙΤΥ
|
| 082 |
1 |
4 |
|a 621.395
|2 20th ed.
|
| 245 |
1 |
0 |
|a Digital circuit testing and testability
|c Parag K. Lala, auth.
|
| 260 |
|
|
|a San Diego
|b Academic Press
|c 1997
|
| 300 |
|
|
|a xii,199p.:fig.
|
| 650 |
|
4 |
|a ΕΠΕΑΕΚ
|9 116438
|
| 650 |
|
4 |
|a INTEGRATED CIRCUITS
|9 24300
|
| 650 |
|
4 |
|a VLSI
|9 24366
|
| 650 |
|
4 |
|a DIGITAL INTEGRATED CIRCUITS
|9 124354
|
| 700 |
1 |
|
|a Lala, Parag K.
|9 116564
|
| 852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΤΜΗΥΠ
|h 621.395 LAL
|t 1
|
| 942 |
|
|
|2 ddc
|
| 952 |
|
|
|0 0
|1 0
|4 0
|6 621_395000000000000_LAL
|7 0
|9 137631
|a CEID
|b CEID
|d 2016-04-24
|l 0
|o 621.395 LAL
|r 2016-04-24 00:00:00
|t 1
|w 2016-04-24
|
| 999 |
|
|
|c 90078
|d 90078
|
