IDDQ testing of VLSI circuits /

Bibliographic Details
Other Authors: Gulati, Ravi K. (επιμελητής), Hawkins, Charles F. (επιμελητής)
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, 1997, c1993.
Edition:5th print.
Series:Frontiers in electronic testing
Subjects:

ΒΚΠ - Πατρα: ALFe

Holdings details from ΒΚΠ - Πατρα: ALFe
Call Number: 621.395 IDD
Copy 1 Available