The state of the Art:from device testing to reconfigurable systems. FTC/3 International symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
New York
IEEE Computer Society Press
c1973
|
| Subjects: |
Μηχανικών Η/Υ και Πληροφορικής: Unknown
| Call Number: |
004.2 |
|---|---|
| Copy 1 | Available |
