Extreme Statistics in Nanoscale Memory Design

Extreme Statistics in Nanoscale Memory Design

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Singhee, Amith
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Rutenbar, Rob A
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer Science+Business Media LLC 2010
Έκδοση:	1
Σειρά:	Integrated Circuits and Systems
Θέματα:	Engineering Electronics Systems engineering Circuits and Systems Electronics and Microelectronics, Instrumentation
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-1-4419-6606-3

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