Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

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Bibliographic Details
Main Author: Foster, Adam
Other Authors: Hofer, Werner
Format: Electronic Kit Book
Language:English
Published: New York, NY Springer Science+Business Media, LLC 2006
Series:NanoScience and Technology
Subjects:
Nanotechnology
Materials
Surfaces (Physics)
Μικροσκόπια
Μοριακή δομή
Particles (Nuclear physics)
Chemistry
Characterization and Evaluation Materials
Surfaces and Interfaces, Thin Films
Biological Microscopy
Atomic and Molecular Structure and Spectra
Solid State Physics and Spectroscopy
Online Access:http://dx.doi.org/10.1007/0-387-37231-8

Internet

http://dx.doi.org/10.1007/0-387-37231-8

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