CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms

CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms

Bibliographic Details
Main Author: Li, Flora M.
Other Authors: Nathan, Arokia
Format: Electronic Kit Book
Language:English
Published: Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2005
Series:Microtechnology and Mems
Subjects:
Optical materials
Electronics
Engineering
Φασματοσκοπική ανάλυση
Chemistry
Optical and Electronic Materials
Electronics and Microelectronics, Instrumentation
Physics and Applied Physics in Engineering
Φασματομετρική ανάλυση
Online Access:http://dx.doi.org/10.1007/b139047

Internet

http://dx.doi.org/10.1007/b139047

ΒΚΠ - Πατρα: Unknown

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