Fundamentals of Nanoscale Film Analysis

Fundamentals of Nanoscale Film Analysis

Bibliographic Details
Main Author: Alford, Terry L.
Other Authors: Feldman, Leonard C., Mayer, James W., 1930-
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer Science+Business Media, Inc. 2007
Subjects:
Surfaces (Physics)
Nanotechnology
Particles (Nuclear physics)
Condensed matter
Electronics
Chemistry
Characterization and Evaluation of Materials
Surfaces and Interfaces, Thin Films
Solid State Physics and Spectroscopy
Condensed Matter
Electronics and Microelectronics, Instrumentation
Online Access:http://dx.doi.org/10.1007/978-0-387-29261-8

Internet

http://dx.doi.org/10.1007/978-0-387-29261-8

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