System-on-chip test architectures : nanometer design for testability /
| Other Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
|
| Series: | The Morgan Kaufmann series in systems on silicon
|
| Subjects: |
ΒΚΠ - Πατρα: BSC
| Call Number: |
621.395 SYS |
|---|---|
| Copy 1 | Available |
| Copy 2 | Available |
ΒΚΠ - Πατρα: ALFe
| Call Number: |
621.395 SYS |
|---|---|
| Copy 3 | Available |
| Copy 4 | Available |
| Copy 5 | Available |
| Copy 6 | Available |
| Copy 7 | Available |
| Copy 8 | Available |
| Copy 9 | Available |
