System-on-chip test architectures : nanometer design for testability /

Παρόμοια τεκμήρια

• VLSI test principles and architectures : design for testability /
  Έκδοση: (2006)
• VLSI test principles and architectures : design for testability /
  Έκδοση: (2006)
• IDDQ testing of VLSI circuits /
  Έκδοση: (1997)
• Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
  ανά: Bushnell, Michael L. (Michael Lee), 1950-
  Έκδοση: (2000)
• Introduction to nMOS and CMOS VLSI systems design /
  ανά: Mukherjee, Amar
  Έκδοση: (1986)